Autism Spectrum Disorder (ASD) is a group of lifelong neurodevelopmental disorders with complicated causes. A key symptom of ASD patients is their impaired interpersonal communication ability. Recent study shows that face scanning patterns of individuals with ASD are often different from those of typical developing (TD) ones. Such abnormality motivates us to study the feasibility of identifying ASD children based on their face scanning patterns with machine learning methods. In this paper, we consider using the bag-of-words (BoW) model to encode the face scanning patterns, and propose a novel dictionary learning method based on dual mode seeking for better BoW representation. Unlike k-means which is broadly used in conventional BoW models to learn dictionaries, the proposed method captures discriminative information by finding atoms which maximizes both the purity and coverage of belonging samples within one class. Compared to the rich literature of ASD studies from psychology and neural science, our work marks one of the relatively few attempts to directly identify high-functioning ASD children with machine learning methods. Experiments demonstrate the superior performance of our method with considerable gain over several baselines. Although the proposed work is yet too preliminary to directly replace existing autism diagnostic observation schedules in the clinical practice, it shed light on future applications of machine learning methods in early screening of ASD.

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